NI PXI-5114數字示波器和信號分析儀器
1.產 品 資 料 介 紹：
中文資料：
NI PXI-5114是一款高性能的數字示波器和信號分析儀器，由NI（National Instruments）公司開發。下面是該設備的配置說明、功能作用以及應用領域的概述：
配置說明：
- 采樣率：NI PXI-5114具有高采樣率，可達到2 GS/s（Giga-Samples per second）。
- 垂直分辨率：它提供12位的垂直分辨率，這意味著可以對信號進行較高精度的測量和分析。
- 通道數：NI PXI-5114具有2個獨立的輸入通道，可以同時采集和分析兩個信號。
- 帶寬：設備的帶寬為400 MHz，適用于高頻信號的測量和分析。
功能作用：
- 數字示波器：NI PXI-5114可以用作數字示波器，用于捕獲和顯示時域波形。它可以對高速、復雜的信號進行準確的捕獲和顯示，幫助工程師分析和故障排除電子系統中的信號問題。
- 信號分析儀：該設備還可以進行信號分析，包括頻譜分析、功率譜密度估計、諧波分析等。它能夠幫助用戶了解信號的頻域特性和頻譜分布，從而進行頻譜相關的應用和算法開發。
應用領域：
- 電子測試與測量：NI PXI-5114廣泛應用于電子測試和測量領域，用于分析各種電子設備和電路的性能、故障診斷和驗證。
- 通信系統：在通信系統中，該設備可用于分析調制解調、信號質量評估、通信信號的時域和頻域特性等。
- 高速數據采集：由于其高采樣率和寬帶寬特性，NI PXI-5114適用于高速數據采集應用，如雷達信號處理、超聲成像、光學傳感器等。
- 科學研究：在科學研究領域，該設備可用于信號分析、波形捕獲和實驗數據采集，為研究人員提供實驗數據和信號處理的工具。
英文資料：
NI PXI-5114 is a high-performance digital oscilloscope and signal analysis instrument developed by NI (National Instruments). The following is an overview of the device's configuration, functional functions, and application areas:
Configuration instructions:
Sampling rate: NI PXI-5114 has a high sampling rate of up to 2 GS/s (Giga Samples per second).
Vertical resolution: It provides a 12 bit vertical resolution, which means that signals can be measured and analyzed with high accuracy.
Number of channels: NI PXI-5114 has 2 independent input channels, which can simultaneously collect and analyze two signals.
Bandwidth: The bandwidth of the device is 400 MHz, suitable for measuring and analyzing high-frequency signals.
Function:
Digital oscilloscope: NI PXI-5114 can be used as a digital oscilloscope to capture and display time-domain waveforms. It can accurately capture and display high-speed and complex signals, helping engineers analyze and troubleshoot signal problems in electronic systems.
Signal analyzer: the equipment can also perform signal analysis, including spectrum analysis, power spectral density estimation, harmonic analysis, etc. It can help users understand the frequency domain characteristics and spectrum distribution of signals, thus conducting spectrum related applications and algorithm development.
Application field:
Electronic Testing and Measurement: NI PXI-5114 is widely used in the field of electronic testing and measurement, for analyzing the performance, fault diagnosis, and verification of various electronic devices and circuits.
Communication system: In communication systems, this device can be used to analyze modulation and demodulation, signal quality evaluation, time-domain and frequency-domain characteristics of communication signals, etc.
High speed data acquisition: Due to its high sampling rate and broadband characteristics, NI PXI-5114 is suitable for high-speed data acquisition applications such as radar signal processing, ultrasound imaging, optical sensors, etc.
Scientific research: In the field of scientific research, this device can be used for signal analysis, waveform capture, and experimental data collection, providing researchers with tools for experimental data and signal processing.
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